Two Hot New Products !!!
SMD-3D: Solder Paste Inspection & Measurement System with Data Collection & SPC Analysis
AVM Series - Automated Dimensional Measurement Software

I Systems' Wafer Inspection/Marking System. Increase your Probers Throughput, Import Electrical Test Data, Inspect Only the Die that Pass Test, Increase your Inspection Efficiency, Improve Data Collection and Analysis, Merge Test and
Inspection Data Automatically and Ink Mark Only Once.
I Systems' Semiautomatic Wafer Inspection System can Help Improve your Bottom Line.


I Systems' provides cost effective inspection solutions for Microelectronic applications.
AV100: Manual SMD/Hybrid Inspection System
AV560: Semi-Automatic SMD, Hybrid and MCM Inspection System
SMD-3D: 3-Dimensional Profiling System

Metallurgical Microscopes
Stereo Microscopes
Universal Modular Zoom Optical Systems
Video Imaging Equipment
Video Print and Storage Systems

We're interested in:
323 Andover Street
Wilmington, MA 01887
978.657.0149
© I Systems, Inc. 1998