SMD-3D: Solder Paste Inspection & Measurement System with Data Collection & SPC Analysis
AVM Series - Automated Dimensional Measurement Software
I Systems' Wafer Inspection/Marking System. Increase your Probers Throughput, Import Electrical Test Data, Inspect Only the Die that Pass Test, Increase your Inspection Efficiency, Improve Data Collection and Analysis, Merge Test and Inspection Data Automatically and Ink Mark Only Once.
I Systems' Semiautomatic Wafer Inspection System can Help Improve your Bottom Line.
Surface Mount and Hybrid Circuit Inspection Products
AV100: Manual SMD/Hybrid Inspection System
AV560: Semi-Automatic SMD, Hybrid and MCM Inspection System
SMD-3D: 3-Dimensional Profiling System
Microscopes and Video Equipment
Measuring Microscope for: Semiconductors, Hybrid Circuits, MCM's, Solder Paste
Metallurgical Microscopes
Stereo Microscopes
Universal Modular Zoom Optical Systems
Video Imaging Equipment
Video Print and Storage Systems
- Your Inspection Applications "We do custom system design"
- Any Comments You May Have
- Answering Your Requests for Information
